Research on 222 nm technology continues to expand and we would like to share a major breakthrough! In this article published by the Council for Optical Radiation Measurements, Holger Claus From Ushio America Inc. gives an excellent breakdown of both skin and eye TLVs and how they are applied in a real world application.
The results of this analysis demonstrate that 222 nm is safe for use in the general public setting and does not cause a risk to eye exposure radiation.
Read the full article starting on page 9 in the link here.